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© 2002 Kluwer Academic Publishers
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Wang, A.Z.H. (2002). ESD Test Models. In: On-Chip ESD Protection for Integrated Circuits. The International Series in Engineering and Computer Science, vol 663. Springer, Boston, MA. https://doi.org/10.1007/0-306-47618-5_2
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DOI: https://doi.org/10.1007/0-306-47618-5_2
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