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References
B.H. Seiss, P. Trouborst and M. Schulz, “Test Point Insertion for Scan-Based BIST,” in Proceedings of the 1991 IEEE European Test Conference, pp. 253–262.
R. Lisanke, F. Brglez, A. J. Degeus and D. Gregory, “Testability Driven Random Test-Pattern Generation,” IEEE Transactions on Computer-Aided Design, Vol. CAD-6, November 1987, pp. 1082–1087.
B. Nadeau-Dostie, D. Burek and Abu S.M. Hassan, “ScanBist: A Multifrequency Scan-Based BIST Method,” IEEE Design & Test of Computers, Vol. 11, No. 1, Spring 1994, pp. 7–17.
P.H. Bardell, J. Savir and W.H. McAnney, Built-in Test for VLSI: Pseudorandom Techniques. J. Wiley and Sons, March 1988.
P.H. Bardell and W.H. McAnney, “Parallel Pseudo-Random Sequences for Built-in Test,” in Proceedings of the 1984 International Test Conference, pp. 302–308.
E.B. Eichelberger, T.W. Williams, “A Logic Design Structure For LSI Testability,” Journal of Design Automation and Fault-Tolerant Computing, Vol. 2, No. 2, May 1978, pp. pp. 165–178.
B. Koenemann, J. Mucha and G. Zwiehoff, “Built-in Logic Block Observation Techniques,” in Digest of Papers of the 1979 Test Conference, pp. 37–41.
J.P. Hayes and A.D. Friedman, “Test Point Placement to Simplify Fault Detection,” in Proceedings of the 1974 Fault Tolerant Symposium, pp. 73–78.
M. Abramovici, M.A. Breuer and A.D. Friedman, Digital Systems Testing and Testable Design. IEEE Press Marketing, 1994.
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(2002). Logic Test and Diagnosis. In: Nadeau-Dostie, B. (eds) Design for AT-Speed Test, Diagnosis and Measurement. Frontiers in Electronic Testing, vol 15. Springer, Boston, MA. https://doi.org/10.1007/0-306-47544-8_3
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DOI: https://doi.org/10.1007/0-306-47544-8_3
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