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Part of the book series: Frontiers in Electronic Testing ((FRET,volume 15))

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References

  1. S.K. Jain and C.E. Stroud, “Built-In Self Testing of Embedded Memories,” in IEEE Design and Test of Computers, October 1986, pp. 27–37.

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© 2002 Kluwer Academic Publishers

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(2002). Memory Test and Diagnosis. In: Nadeau-Dostie, B. (eds) Design for AT-Speed Test, Diagnosis and Measurement. Frontiers in Electronic Testing, vol 15. Springer, Boston, MA. https://doi.org/10.1007/0-306-47544-8_2

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  • DOI: https://doi.org/10.1007/0-306-47544-8_2

  • Publisher Name: Springer, Boston, MA

  • Print ISBN: 978-0-7923-8669-8

  • Online ISBN: 978-0-306-47544-3

  • eBook Packages: Springer Book Archive

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