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References
S.K. Jain and C.E. Stroud, “Built-In Self Testing of Embedded Memories,” in IEEE Design and Test of Computers, October 1986, pp. 27–37.
B. Nadeau-Dostie, A Silburt and V.K. Agarwal, “A Serial Interfacing Technique for External and Built-In Self-Testing of Embedded Memories,” in IEEE Design and Test of Computers, vol. 7, no.2, April 1990, pp. 56–64.
S. Wood, R. Gibson, S. Adham and B. Nadeau-Dostie, “A 5 GHz/s 9-Port Application-Specific SRAM with Built-in Self-Test,” in Proceedings of the 1995 IEEE International Workshop on Memory Technology Design and Testing, San Jose, August 7–8, 1995, pp. 66–75.
M. Nicolaidis, “An Efficient Built-In Self-Test Scheme for Functional Test of Embedded RAMs,” in Proceedings of the 15th IEEE International Conference on Fault-Tolerant Computing Symposium, July 1985, pp. 118–123.
M. Nicolaidis, “Transparent BIST for RAMs,” in Proceedings of the IEEE International Test Conference, 1992, pp. 598–607.
M. Nicolaidis, et. al., “Trade-offs in Scan Path and BIST implementations of RAMs” Journal of Electronic Testing: Theory and Applications, vol. 5, no. 2, May 1994, pp. 273–283.
A.J. van de Goor, Testing Semiconductor Memories: Theory and Practice. John Wiley & Sons, England, 1991.
P. Mazumder and K. Chakraborty, Testing and Testable Design of High-Density Random Access Memories. Kluwer Academic Publishers, Norwell, MA, 1996.
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(2002). Memory Test and Diagnosis. In: Nadeau-Dostie, B. (eds) Design for AT-Speed Test, Diagnosis and Measurement. Frontiers in Electronic Testing, vol 15. Springer, Boston, MA. https://doi.org/10.1007/0-306-47544-8_2
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DOI: https://doi.org/10.1007/0-306-47544-8_2
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