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Scanning Tunnelling Spectroscopy of Layered Cuprates and Transition Metal Chalcogenides

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Electron Spectroscopies Applied to Low-Dimensional Materials

Part of the book series: Physics and Chemistry of Materials with Low-Dimensional Structures ((PCMALS,volume 24))

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Abstract

Scanning tunnelling microscopy (STM) and spectroscopy (STS) have been performed on layered materials, cuprate superconductors and transition metal dichalcogenides, in order to elucidate the properties of high temperature superconductivity and electron localization respectively, in close correlation with their low dimensional electron properties.

In Bi2Sr2CaCu2O8 and YBa2Cu3O7 cuprates, the layered electronic character involves metallic (superconducting) and insulating (non-superconducting) blocks, which were directly probed by the site-specific STS. By treating the sample surface in situ, we reproducibly observed a superconducting gap structure, characteristic of the CuO3 layers, with a V-shaped in-gap conductance profile and an essentially flat background. These features are consistent with a d-wave pairing mechanism.

In 1T-TaSxSe2−x it was found that the narrow, almost half-full conduction band tends to become narrower, and finally splits into two sub-bands, with S doping at 77 K. This strongly supports a Mott localization scenario, triggered by the reduction of carriers. In the Mott localized phase, subsurface impurities were imaged as huge rings with diameters up to 15 nm, reflecting the substantial shortening of the effective wavelengths of electronic excitations.

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© 2002 Kluwer Academic Publishers

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Hasegawa, T., Lin, M., Shiino, O. (2002). Scanning Tunnelling Spectroscopy of Layered Cuprates and Transition Metal Chalcogenides. In: Hughes, H.P., Starnberg, H.I. (eds) Electron Spectroscopies Applied to Low-Dimensional Materials. Physics and Chemistry of Materials with Low-Dimensional Structures, vol 24. Springer, Dordrecht. https://doi.org/10.1007/0-306-47126-4_8

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  • DOI: https://doi.org/10.1007/0-306-47126-4_8

  • Publisher Name: Springer, Dordrecht

  • Print ISBN: 978-0-7923-6526-6

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