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Magnetic Domain Imaging of Thin Metallic Layers Using PEEM

  • Chapter
Physics of Low Dimensional Systems

Abstract

Photoemission electron microscopy (PEEM) in combination with resonant excitation by circularly polarized soft X-rays has proven to be a powerful analytical tool for the study of magnetic microstructures and multilayers. In this type of electron microscope the lateral intensity distribution of the emitted low-energy secondary or photoelectrons is imaged by an electron-optical system. Owing to its fast parallel image acquisition, its wide zoom range allowing fields of view from almost 1 mm down to a few µm combined with a high base-resolution of the order of 20 nm, the method offers a unique access to many aspects in surface and thin film magnetism on the mesoscopic length scale. Magnetic contrast is achieved by the magnetic circular or linear dichroism. Sum-rule analysis allows to extract quantitative information about the spin and orbital magnetic moments of 3d-transition metals. Two other modes of magnetic imaging via PEEM work with simple UV light sources and are therefore highly attractive for standard laboratory applications. The magnetic stray-field close to the sample surface leads to a Lorentz-type contrast. A third type of contrast arises as a consequence of a small rotation of the displacement vector inside a magnetic material, a phenomenon which is also responsible for the well-known magneto-optical Kerr-effect. Examples and typical applications of magnetic imaging using PEEM are discussed.

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  1. Institut für Physik, Johannes Gutenberg-Universität Mainz, Staudinger Weg 7, 55099, Mainz, Germany

    G. Schönhense

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  1. G. Schönhense
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  1. Instituto Potosino de Investigación Cientifica y Tecnológica, San Luis Potosí, S.L.P., Mexico

    J. L. Morán-López

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Schönhense, G. (2001). Magnetic Domain Imaging of Thin Metallic Layers Using PEEM. In: Morán-López, J.L. (eds) Physics of Low Dimensional Systems. Springer, Boston, MA. https://doi.org/10.1007/0-306-47111-6_31

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  • DOI: https://doi.org/10.1007/0-306-47111-6_31

  • Publisher Name: Springer, Boston, MA

  • Print ISBN: 978-1-4757-0571-3

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