Abstract
Atomic force microscopy (AFM) technique has been successfully used to study the sublimation rate of explosive solid film on a smooth surface. Based on the experimental results, a dipole-induced dipole propagation potential is employed to explain a nonlinear sublimation rate of solid TNT thin film very close to the interface. In this model, three important physical parameters, bulk TNT sublimation rate δ0, surface interaction potential Uo and the effective range of the surface potential h o , are introduced with no arbitrary constants. It is argued that this type of model reflects a general phenomena rather than a special case. This model has been further extended to describe the evaporation rate of liquid droplets resting on a smooth surface. It is also demonstrated that tapping mode AFM is capable of imaging highly viscous explosive droplets under ambient conditions.
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© 2002 Kluwer Academic Publishers
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Mu, R., Ueda, A., Tung, Y., Henderson, D., Curby, W., Mercado, A. (2002). A New Approach to Examine Interfacial Interaction Potential between a Thin Solid Film or a Droplet and a Smooth Substrate. In: Cohen, S.H., Lightbody, M.L. (eds) Atomic Force Microscopy/Scanning Tunneling Microscopy 3. Springer, Boston, MA. https://doi.org/10.1007/0-306-47095-0_9
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DOI: https://doi.org/10.1007/0-306-47095-0_9
Publisher Name: Springer, Boston, MA
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