Abstract
AFM is an easy, nondestructive tool to study the structure of asphalt and the association and size of its individual particles. Best observation conditions were obtained with rigid cantilevers and a very smooth surface (drop form). In comparison to AFM, SEM needs an adequate preparation method to prevent artefacts by the deoiling step. This was obtained by using filter paper, which keeps the structure in place.
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© 2002 Kluwer Academic Publishers
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Loeber, L., Morel, J., Sutton, O., Valleton, JM., Muller, G. (2002). Atomic Force Microscopy—A New and Complementary Tool in Asphalt Research Compared to Scanning Electron Microscopy. In: Cohen, S.H., Lightbody, M.L. (eds) Atomic Force Microscopy/Scanning Tunneling Microscopy 3. Springer, Boston, MA. https://doi.org/10.1007/0-306-47095-0_20
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DOI: https://doi.org/10.1007/0-306-47095-0_20
Publisher Name: Springer, Boston, MA
Print ISBN: 978-0-306-46297-9
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