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Mechanically Flexible Nonvolatile Field Effect Transistor Memories with Ferroelectric Polymers

  • Richard H. Kim
  • Cheolmin ParkEmail author
Chapter
  • 61 Downloads
Part of the Topics in Applied Physics book series (TAP, volume 131)

Abstract

Great efforts have been devoted to improve the properties of nonvolatile memory with field effect transistor architecture containing ferroelectric polymers (NV-FeFETs) due to the potential advantages of the ferroelectric polymers including their low cost, easy fabrication based on solution processes, and mechanical flexibility. Here, we review the current status of development in particular on mechanically flexible NV-FeFETs. In addition, recent researches that demonstrate the importance of the analysis techniques to characterize the mechanical properties of thin films composing a FeFET are discussed, including nano-indentation and nano-scratch test.

Notes

Acknowledgements

This work was supported by the National Research Foundation of Korea (NRF) grant funded by the Korea government (MEST) (No.2014R1A2A1A01005046).

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© Springer Nature Singapore Pte Ltd. 2020

Authors and Affiliations

  1. 1.Department of Materials Science and EngineeringYonsei UniversitySeoulSouth Korea

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