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Electron Microscopy Observation of Solid Particles

  • Kanjiro TorigoeEmail author
Chapter

Abstract

Electron microscopy is an indispensable tool to observe and analyze physical characteristics of small samples being invisible under visible light. In this chapter, first the reason why the electron microscopy is utilized is briefly explained. Subsequently basic structures of scanning electron microscopy (SEM) and transmission electron microscopy (TEM) are presented. Finally, answers for practical questions, e.g., how to prepare the samples and what is the appropriate image, will be given.

Keywords

SEM TEM Bright-field image Dark-field image Electron diffraction 

Further Readings

  1. 1. C. Barry Carter, D. B. Williams (eds.), Transmission Electron Microscopy – Diffraction, Imaging, and Spectroscopy (Springer, Cham, 2016)Google Scholar
  2. 2. T. Pradeep, NANO: The Essentials – Understanding Nanoscience and Technology (McGraw Hill, New Delhi, 2008)Google Scholar

References

  1. 1.
    K. Torigoe, Y. Nakajima, K. Esumi, J. Phys. Chem. B 97, 8304 (1993)CrossRefGoogle Scholar
  2. 2.
    H. Liao, H. Zheng, Annu. Rev. Phys. Chem. 67, 719–747 (2006)CrossRefGoogle Scholar

Copyright information

© Springer Nature Singapore Pte Ltd. 2019

Authors and Affiliations

  1. 1.Department of Pure and Applied ChemistryTokyo University of ScienceNodaJapan

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