Effect of Mg Concentration on the Structural, Morphological and Optical Properties of Ternary ZnMgO Nanocrystalline Thin Films

  • Shashikant RajpalEmail author
  • S. R. Kumar
Conference paper


A technological challenge is to develop a ternary semiconductor ZnMgO thin film by controlling the concentration of Mg in aqueous medium that allows us to tune the band gap energy between 3.35 and 3.55 eV. In this paper, ZnMgxO (x = 0.00263, 0.00525 and 0.01313 M) films were deposited on zinc substrate containing Na3C6H5O7 × 2H2O, MgCl2 × 6H2O and 30% H2O2 in 40 ml of distilled water. The electrodeposition technique is used to develop the film. The structural, morphological, compositional analysis and optical properties of different concentration of developed ZnMgO thin films were studied by XRD, SEM, EDS, UV–Vis and PL. The diffraction peak observed at 2θ ≃ 36° with preferred plane indicates the crystalline nature of ZnMgO film. Grain size has been calculated by using Scherrer formula. A SEM photograph shows that grains are uniform and densely distributed over the surface. Compositional analysis reveals the presence of Zn, Mg and O. With increase in Mg concentration, the optical energy band gap of ZnMgO films varied from 3.42 to 3.52 eV and photoluminescence emission of ZnMgO film were also observed.


Concentration Characterization Optical Structural Thin films ZnMgO 



Authors are very much thankful to fund provided by Ministry of HRD, Government of India. We are also thankful to Central facilities of Birla Institute of Technology, Ranchi, for different analyses.


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© Springer Nature Singapore Pte Ltd. 2019

Authors and Affiliations

  1. 1.Department of Applied Sciences and HumanitiesNational Institute of Foundry and Forge TechnologyRanchiIndia

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