Study of Radiation-Induced Soft-Errors in FPGAs for Applications at High-Luminosity \(e^+e^-\) Colliders

  • Raffaele GiordanoEmail author
  • Gennaro Tortone
  • Alberto Aloisio
Conference paper
Part of the Springer Proceedings in Physics book series (SPPHY, volume 212)


At the KEK laboratory (Tsukuba, Japan), the SuperKEKB \(e^{+}e^{-}\) collider has been commissioned in February 2016 and it has been operated until June 2016 completing the so-called Phase-1.

In this work, we present measurements of configuration soft-errors induced by radiation in a SRAM-based FPGA device installed within 1 m from one of the SuperKEKB beam pipes. During the SuperKEKB operation, we continuously read back the FPGA configuration memory in order to spot upsets and we logged power consumption at the different power rails of the device in order to search for total dose effects. Since the operation current of the SuperKEKB collider spanned a range between 50 and 500 mA for both the electron and positron rings, the experimental scenario allowed us to perform measurements in different radiation conditions.


FPGA Upset Radiation Collider Accesso Aperto MIUR 



This work is part of the ROAL SIR project funded by the Italian Ministry of Research (MIUR), grant no. RBSI14JOUV. “Accesso Aperto MIUR". The institutions which contributed to the results reported in this work are listed below as affiliations of the authors. We also wish to thank all the members of the BEAST2 community for supporting this activity.


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Copyright information

© Springer Nature Singapore Pte Ltd. 2018

Authors and Affiliations

  • Raffaele Giordano
    • 1
    • 2
    Email author
  • Gennaro Tortone
    • 2
  • Alberto Aloisio
    • 1
    • 2
  1. 1.University of Naples ‘Federico II’NaplesItaly
  2. 2.INFN Sezione di NapoliNaplesItaly

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