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Conductive Atomic Force Microscopy

  • Risa FujiEmail author
Chapter

Abstract

In CAFM mode as shown in Fig. 9.1, which is based on contact mode, a bias voltage is applied during scanning between the probe and the sample, the current that flows is detected, and images of the in-plane distribution are created at the same time as images of the shape. Moreover, this system can evaluate electrical properties of the sample surface by I/V measurement function which can measure the current between the probe and the sample while sweeping the sample bias voltage.

Keywords

Current image I/V measurement Electrical property Bias voltage Contact mode 

Reference

Copyright information

© Springer Nature Singapore Pte Ltd. 2018

Authors and Affiliations

  1. 1.Global Application Development Center, Analytical & Measuring Instruments DivisionShimadzu CorporationKanagawaJapan

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