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Reflectance Difference Spectroscopy

  • Ken-ichi ShudoEmail author
  • Shin-ya Ohno
Chapter

Abstract

Reflectance difference spectroscopy (RDS) is a linear optical method capable of performing highly sensitive measurements to the reflectance anisotropy (RA) of solid surfaces, providing information on the surface structure and electronic states near the surface (Shudo et al. in Frontiers in optical methods: nano-characterization and coherent control. Springer-Verlag GmbH, Berlin/Heidelberg, 2013, Weightman et al. in Rep Prog Phys 68:1251, 2005 [1, 2]).

Keywords

Optical measurement Spectroscopy Anisotropy Ultrafast phenomena 

References

  1. 1.
    Shudo, K., Katayama, I., Ohno, S. (eds): Frontiers in optical methods: nano-characterization and coherent control, springer series in optical sciences, Vol. 180, ISBN 978–3-642-40593-8 (2013, Springer-Verlag GmbH, Berlin/Heidelberg)Google Scholar
  2. 2.
    Weightman, P., Martin, D.S., Cole, R.J., Farrell, T.: Reflectance anisotropy spectroscopy. Rep. Prog. Phys. 68, 1251 (2005)CrossRefGoogle Scholar
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Copyright information

© Springer Nature Singapore Pte Ltd. 2018

Authors and Affiliations

  1. 1.Faculty of Engineering/ScienceYokohama National UniversityYokohamaJapan

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