Photoelectron Diffraction

  • Fumihiko MatsuiEmail author
  • Tomohiro Matsushita


The discontinuity of bulk properties at material surfaces and interfaces can give rise to various useful functionalities. The visualization of the three-dimensional atomic arrangement of such structures is essential in materials science and engineering. Photoelectron diffraction (PED) is an element-selective method for local surface structure analysis [1].


Atomic structure Subsurface Adsorbate Element selective Local electronic structure 


  1. 1.
    Hüfner, S.: Photoelectron Spectroscopy 3 ed. Springer (2003). Fadley, C. S.: X-ray photoelectron spectroscopy: Progress and perspectives. J. Electron Spectrosc. Relat. Phenom. 2(32), 178–179 (2010)Google Scholar
  2. 2.
    Tanuma, S.: Electron attenuation lengths in surface analysis by auger and x − ray photoelectron spectroscopy, In: Briggs, D., Grant, J.T., IM Publications and Surface Spectra Limited, pp. 259–294 (2003)Google Scholar
  3. 3.
    Greber, T., Wider, J., Osterwalder, J.: X-ray photoelectron diffraction in the backscattering geometry: a key to adsorption sites and bond lengths at surfaces. Phys. Rev. Lett. 81, 1654 (1998)CrossRefGoogle Scholar
  4. 4.
    Woodruff, D.P.: Adsorbate structure determination using photoelectron diffraction. Surf. Sci. Rep. 62, 1–38 (2007)CrossRefGoogle Scholar
  5. 5.
    García de Abajo, F.J., Van Hove, M.A., Fadley, C.S.: Multiple scattering of electrons in solids and molecules: A cluster-model approach. Phys. Rev. B. 63, 75404 (2001)Google Scholar
  6. 6.
    Matsushita, T., et al.: Photoelectron holography with improved image reconstruction. J. Electron Spectrosc. Relat. Phenom. 178–179, 195–220 (2010)CrossRefGoogle Scholar
  7. 7.
    Daimon, H.: New display-type analyzer for the energy and the angular distribution of charged particles. Rev. Sci. Instum. 59, 545 (1988)CrossRefGoogle Scholar
  8. 8.
    Dreiner, S. et al.,: Local atomic environment of si suboxides at the sio2/si(111) interface determined by angle-scanned photoelectron diffraction. Phys. Rev. Lett. 86, 4068 (2001); Structural Analysis of the SiO2/Si(100) Interface by Means of Photoelectron Diffraction ibid. 93, 126101 (2004)CrossRefGoogle Scholar
  9. 9.
    Daimon, H.: “Stereoscopic microscopy of atomic arrangement by circularly polarized-light photoelectron diffraction”. Phys. Rev. Lett. 86, 2034 (2001)CrossRefGoogle Scholar
  10. 10.
    Matsui, F., Matsushita, T., Kato, Y., Hashimoto, M., Inaji, K., Daimon, H.: “Atomic-layer resolved magnetic and electronic structure analysis of ni thin film on a cu(001) surface by diffraction spectroscopy” phys. Rev. Lett. 100, 207201 (2008)CrossRefGoogle Scholar

Copyright information

© Springer Nature Singapore Pte Ltd. 2018

Authors and Affiliations

  1. 1.Graduate School of Materials ScienceNara Institute of Science and TechnologyNaraJapan
  2. 2.Japan Synchrotron Radiation Research InstituteHyogoJapan

Personalised recommendations