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Low-Energy Ion Scattering Spectroscopy

  • Kenji UmezawaEmail author
Chapter

Abstract

Low-energy ions scattering (less than 5 keV) is a powerful tool for the analysis of “first monolayer”.

Keywords

Low-energy ion scattering Atomic collision Ultra-high vacuum 

References

  1. 1.
    Rabalais, J.W.: Low Energy Ion-Surface Interactions. Wiley, NewYork (1994)Google Scholar
  2. 2.
    Rabalais, J.W.: Principles and Applications of Ion Scattering Spectroscopy. Wiley, New York (2003)Google Scholar
  3. 3.
    Buck, T.M., Wheatley, G.H., Verheij, L.K.: Low energy neon ion scattering and neutralization on first and second layers of a Ni(001) surface. Surf. Sci. 90, 635–647 (1979)CrossRefGoogle Scholar
  4. 4.
    Katayama, M., Nomura, E., Kanekama, N., Soejima, H., Aono, M.: Coaxial impact-collision ion scattering spectroscopy (CAICISS): a novel method for surface structure analysis. Nucl. Instrum. Meth. Phys. Res. B 33, 857–861 (1988)CrossRefGoogle Scholar
  5. 5.
    Sumitomo, K., Oura, K., Katayama, I., Shoji, F., Hanawa, T.: “A TOF-ISS/ERDA apparatus for solid surface analysis”, “Coaxial impact-collision ion scattering spectroscopy (CAICISS): a novel method for surface structure analysis”. Nucl. Instrum. Meth. Phys. Res. B 33, 871–875 (1988)CrossRefGoogle Scholar
  6. 6.
    Souda, R., Aono, M.: Interactions of low energy He+, He0 and He* with solid surfaces. Nucl. Instrum. Meth. Phys. Res. B 15, 114–121 (1986)CrossRefGoogle Scholar
  7. 7.
    Umezawa, K., Nakanishi, S., Yoshimura, M., Ojima, K., Ueda, K., Gibson, W.M.: Ag/Cu(111) surface structure and metal epitaxy by impact-collision ion-scattering spectroscopy and scanning tunneling microscopy. Phys. Rev. B 63, 035402 (2000)CrossRefGoogle Scholar
  8. 8.
    Williams, R., Kato, M., Daley, R.S., Aono, M.: Scattering cross sections for ions colliding sequentially with two target atoms. Surf. Sci. 225, 355–366 (1990)CrossRefGoogle Scholar
  9. 9.
    Robinson, M.T., Yorrens, I.M.: Computer simulation of atomic displacement cascades in solids in the binally-collision approximation, Phys. Rev. B9, 5008–5024 (1974)CrossRefGoogle Scholar
  10. 10.
    Yuan, B., Yu, F.C., Tang, S.M.: A database method for binary atomic scattering angle calculation. Nucl. Instrum. Meth. B83, 413–418 (1993)CrossRefGoogle Scholar
  11. 11.
    Denier van der Gon, A.W., Smith, R.J., Gay, J.M., O’Connor, D.J., van der Veen, J.F.: Melting of Al surfaces. Surf. Sci. 227, 143–149 (1990)CrossRefGoogle Scholar
  12. 12.
    Nieus, H.: Ion scattering spectroscopy and scanning tunneling microscopy: A powerful combination for surface structural analysis. Appl. Phys. A 53, 388–402 (1991)CrossRefGoogle Scholar

Copyright information

© Springer Nature Singapore Pte Ltd. 2018

Authors and Affiliations

  1. 1.Department of Physics, College of Integrated Arts SciencesOsaka Prefecture UniversitySakai, OsakaJapan

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