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Kelvin Probe Force Microscope

  • Risa FujiEmail author
Chapter

Abstract

KPFM mode as shown in Fig. 51.1 generates images based on the electric potential of the sample surface. Applying an AC voltage to a conductive cantilever and detecting the resulting electric force makes it possible to observe the surface profile and, at the same time, the surface potential distribution.

Keywords

Surface potential AC bias voltage Surface potential calibration 

References

  1. 1.
    Nonnenmacher, M., O’Boyle, M.P., Wickramasinghe, H.K.: Kelvin probe force microscopy. Appl. Phys. Lett. 58, 2921 (1991)CrossRefGoogle Scholar
  2. 2.
    Morita, S. Atomic/Molecular Nanomechanics. 33 (2011)Google Scholar

Copyright information

© Springer Nature Singapore Pte Ltd. 2018

Authors and Affiliations

  1. 1.Global Application Development Center Analytical & Measuring Instruments DivisionShimadzu CorporationKanagawaJapan

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