Atom Probe Field Ion Microscope
A high electric field of greater than 0.5 V/Å can be generated over the apex of a sharpened metallic needle (tip) with a radius of less than 100 nm, by application of a voltage of higher than a few kV to the tip.
KeywordsMass spectroscopy Atomic resolution microscope Field ionization Field evaporation Field emission
- 2.Miller, M.K., Smith, G.D.W.: Atom Probe Microanalysis: Principles and Applications to Materials Problems. Materials Research Society, Pittsburgh (1989)Google Scholar
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