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Atom Probe Field Ion Microscope

  • Masahiko TomitoriEmail author
Chapter

Abstract

A high electric field of greater than 0.5 V/Å can be generated over the apex of a sharpened metallic needle (tip) with a radius of less than 100 nm, by application of a voltage of higher than a few kV to the tip.

Keywords

Mass spectroscopy Atomic resolution microscope Field ionization Field evaporation Field emission 

References

  1. 1.
    Tsong, T.T.: Atom-Probe Field Ion Microscopy: Field Ion Emission, and Surfaces and Interfaces at Atomic Resolution. Cambridge University Press, Cambridge (1990)CrossRefGoogle Scholar
  2. 2.
    Miller, M.K., Smith, G.D.W.: Atom Probe Microanalysis: Principles and Applications to Materials Problems. Materials Research Society, Pittsburgh (1989)Google Scholar

Copyright information

© Springer Nature Singapore Pte Ltd. 2018

Authors and Affiliations

  1. 1.School of Materials ScienceJapan Advanced Institute of Science and TechnologyIshikawaJapan

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