High-Speed Atomic Force Microscopy
The basic principle of high-speed atomic force microscopy (HS-AFM) is similar to a conventional AFM in which force interactions between a sharp needle at the end of a cantilever and a solid surface is detected through the deflection of the cantilever (Binnig et al. Phys Rev Let 56:930–933, 1986 ).
KeywordsSingle-molecule imaging Protein Conformational dynamics Molecular interaction
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