Advertisement

High-Speed Atomic Force Microscopy

  • Takayuki UchihashiEmail author
Chapter

Abstract

The basic principle of high-speed atomic force microscopy (HS-AFM) is similar to a conventional AFM in which force interactions between a sharp needle at the end of a cantilever and a solid surface is detected through the deflection of the cantilever (Binnig et al. Phys Rev Let 56:930–933, 1986 [1]).

Keywords

Single-molecule imaging Protein Conformational dynamics Molecular interaction 

References

  1. 1.
    Binnig, G., Quate, C.F., Gerber, C.: Atomic force microscope. Phys. Rev. Lett. 56, 930–933 (1986)CrossRefGoogle Scholar
  2. 2.
    Zhomg, Q., Iniss, D., Kjoller, K., Elings, V.: Fractured polymer/silica fiber surface studied by tapping mode atomic force microscopy. Surf. Sci. 290, L688–L692 (1993)Google Scholar
  3. 3.
    Ando, T., Uchihashi, T., Fukuma, T.: High-speed atomic force microscopy for nano-visualization of dynamic biomolecular processes. Prog. Surf. Sci. 83, 337–437 (2008)CrossRefGoogle Scholar
  4. 4.
    Kodera, N., Yamamoto, D., Ishikawa, R., Ando, T.: Video imaging of walking myosin V by high-speed atomic force microscopy. Nature 468, 72–76 (2010)CrossRefGoogle Scholar

Copyright information

© Springer Nature Singapore Pte Ltd. 2018

Authors and Affiliations

  1. 1.Department of PhysicsNagoya UniversityAichiJapan

Personalised recommendations