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Frequency-Modulation Atomic Force Microscopy

  • Masayuki AbeEmail author
Chapter

Abstract

Frequency-Modulation atomic force microscopy (FM-AFM), one of the AFM modes, can image surface single atoms and molecules. Different from scanning tunneling microscopy (STM) that has also atomic resolution, FM-AFM can be operated on the insulator surface. Force spectroscopy using FM-AFM measures chemical bonding force between atoms of the AFM tip and sample surface.

Keywords

Force Cantilever FM Atomic resolution 

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Copyright information

© Springer Nature Singapore Pte Ltd. 2018

Authors and Affiliations

  1. 1.Graduate School of Engineering ScienceCenter for Science and Technology Under Extreme Conditions, Osaka UniversityOsakaJapan

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