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Transmission Electron Microscope

  • Masanori MitomeEmail author
Chapter

Abstract

TEM is an observation technique in which a high coherent electron wave (a plane wave) illuminates a thin specimen, and a transmitted electron wave is collected by magnetic lenses to make high-resolution images and transmission electron diffraction patterns. A basic principle for TEM is very similar to that for an optical microscope, and thus, it can be noticed that a light wave in the optical microscope is replaced with an electron wave in TEM.

Keywords

Crystal structure analysis Elemental analysis High resolution Electron diffraction In situ observation 

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Copyright information

© Springer Nature Singapore Pte Ltd. 2018

Authors and Affiliations

  1. 1.International Center for Materials NanoarchitectonicsNational Institute for Materials ScienceTsukubaJapan

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