Transmission Electron Microscope
TEM is an observation technique in which a high coherent electron wave (a plane wave) illuminates a thin specimen, and a transmitted electron wave is collected by magnetic lenses to make high-resolution images and transmission electron diffraction patterns. A basic principle for TEM is very similar to that for an optical microscope, and thus, it can be noticed that a light wave in the optical microscope is replaced with an electron wave in TEM.
KeywordsCrystal structure analysis Elemental analysis High resolution Electron diffraction In situ observation
- 1.Born M., Wolf W.: Principles of Optics, 5th ed. Pergamon Press, Oxford (1975) (§8.6.3)Google Scholar