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Characterization of Defects in Ceramics by Computerized Tomography with High Spatial Resolution

  • B. Illerhaus
  • J. Goebbels
  • H. Heidt
  • W. Müller
  • Y. Onel
  • P. Reimers
  • V. Wolff
Chapter

Abstract

X-ray computerized tomography with spatial resolution of a few tens of micrometers and high contrast resolution offers new possibilities for the detection of shrinkage cracks and incomplete wetting of the contact surfaces in soldered metal — ceramic joints, of crack growth due to bending tests, the determination of the material in small inclusions and the resolution of density gradients in the neighbourhood of voids in ceramic materials.

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References

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    Kress, J.W and Feldkamp, L.A, X-ray tomography applied to NDE of ceramics. Am. Soc. Mech. Eng. 83-GT-206, 1983.Google Scholar
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    Goebbels, J, Heidt, H, Kettschau, A and Reimers, P, Computed X-ray tomography of ceramic turbine rotors. Proc. 2nd Int. Symp. Ceramic Materials and Components for Engines, Lübeck-Travemünde, April 14–-17, 1986, pp 825–831.Google Scholar
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    Heidt, H, Goebbels, J, Reimers, P and Kettschau, A, Developement and application of an universal CAT-scanner. Proc. 11th World Conf. on NDT, Las Vegas, Nov. 3–8, 1985, pp. 664–671.Google Scholar
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    Illerhaus, B, Goebbels, J, Onel, Y and Reimers, P, Nondestructive evaluation of ceramics with computerized tomographie in the micrometer range. Proc. ACerS/ASNT Corn. on Nondestructive Evaluation of Modern Ceramics, July 9–12, 1990.Google Scholar
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    Reimers, P, Kettschau, A and Goebbels, J, Region of interest (ROI) mode in industrial X-ray CT. Proc. Industrial Computerized Tomography Topical, Seattle, WA, July 1989, p. 48.Google Scholar

Copyright information

© Elsevier Science Publishers Ltd and MPA Stuttgart 1992

Authors and Affiliations

  • B. Illerhaus
    • 1
  • J. Goebbels
    • 1
  • H. Heidt
    • 1
  • W. Müller
    • 1
  • Y. Onel
    • 1
  • P. Reimers
    • 1
  • V. Wolff
    • 1
  1. 1.Federal Institute for Material Research and Testing (BAM)Berlin 45Germany

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