Basic auxiliary relationships

  • R. G. ForbesEmail author
Part of the Condensed Matter book series (volume 45B)


This chapter provides auxiliary relationship of characteristic field parameters in order to relate local emission current density to the total emission current and barrier field to the emission voltage.


  1. [20J]
    Jeans, J.H.: The Mathematical Theory of Electricity and Magnetism, 4th edn, p. 194. CUP, Cambridge (1920)Google Scholar
  2. [28E]
    Eyring, C.F., MacKeown, S.S., Millikan, R.A.: Phys. Rev. 31, 900 (1928)ADSCrossRefGoogle Scholar
  3. [49Hal]
    Hall, R.N.: J. Appl. Phys. 20, 925 (1949)ADSMathSciNetCrossRefGoogle Scholar
  4. [51B]
    Becker, J.A.: Bell Syst. Tech. J. 20, 907 (1951). Formula attributed to S.P. Morgan, private communicationCrossRefGoogle Scholar
  5. [53D]
    Dyke, W.P., Trolan, J.K., Dolan, W.W., Barnes, G.: J. Appl. Phys. 24, 570 (1953)ADSCrossRefGoogle Scholar
  6. [64V]
    Vibrans, G.E.: J. Appl. Phys. 35, 2855 (1964)ADSCrossRefGoogle Scholar
  7. [67M]
    Miller, H.C.: J. Appl. Phys. 38, 4501 (1967)ADSCrossRefGoogle Scholar
  8. [68B]
    Beckey, H.D., Krone, H., Röllgen, F.W.: J. Phys. E: Sci. Instr. 1, 118 (1968)ADSCrossRefGoogle Scholar
  9. [69S]
    Swatik, D.S.: PhD thesis, University of Illinois (1969). See p. 23Google Scholar
  10. [71C]
    Coelho, R., Debeau, J.: J. Phys. D Appl. Phys. 4, 1266 (1971)ADSCrossRefGoogle Scholar
  11. [81L]
    Latham, R.V.: High Voltage Vacuum Insulation. Academic, London (1981)Google Scholar
  12. [84Mil]
    Miller, H.C.: J. Appl. Phys. 55, 158 (1984)ADSCrossRefGoogle Scholar
  13. [91K]
    Kosmahl, H.G.: IEEE Trans. Electron Devices. 38, 1534 (1991)ADSCrossRefGoogle Scholar
  14. [91M]
    Mair, G.L.R., Forbes, R.G.: J. Phys. D Appl. Phys. 24, 2217 (1991)ADSCrossRefGoogle Scholar
  15. [01E]
    Edgcombe, C.J., Valdrè, U.: J. Microsc. 203, 188 (2001)MathSciNetCrossRefGoogle Scholar
  16. [01K]
    Kokkaris, G.C., Kyritsakis, A., Xanthakis, J.P.: J. Appl. Phys. 91, 4580 (2001)ADSGoogle Scholar
  17. [03F]
    Forbes, R.G., Edgcombe, C.J., Valdrè, U.: Ultramicroscopy. 95, 57 (2003)CrossRefGoogle Scholar
  18. [09P1]
    Poglerov, E.G., Zhbanov, A.I., Chang, Y.-C.: EPL. 85, 17001 (2009)ADSCrossRefGoogle Scholar
  19. [09P2]
    Poglerov, E.G., Zhbanov, A.I., Chang, Y.-C.: Ultramicroscopy. 109, 373 (2009)CrossRefGoogle Scholar

Copyright information

© Springer-Verlag GmbH Germany 2018

Authors and Affiliations

  1. 1.Advanced Technology InstituteUniversity of SurreyGuildfordUK

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