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KBTA: An Expert Aid for Chip Test

  • Bryant W. York
Conference paper

Abstract

The Knowledge Based Test Assistant (KBTA) is an expert system which assists hardware test engineers in the task of writing programs for MSI/LSI devices. It was developed to be used primarily by test engineers who acquire chips from external vendors and prepare test programs based solely on the vendor’s data book descriptions. Since gate level descriptions are unavailable to these engineers. standard tools which do automatic test vector generation via some form of the D-algorithm are not applicable. Thus. a serious problem faced by the test engineer is how to generate test vectors from the functional description of a device. Over the years engineers have developed and heavily used ad hoc vector sets for the functional testing of various devices and these vector sets represent one form of expert knowledge utilized by KBTA. Because there are no widely accepted functional level fault models. there are no quantitative measures of fault coverage for these ad hoc vector sets. Hence there are no objective measures of the quality of this expert knowledge. Since KBTA is an expert system and expert systems are highly dependent upon the quality of the expert knowledge they contain. the quality of the programs it produces should improve with the increase in quality of its expert knowledge. The main objective of KBTA is to aid the test engineer in doing her job more effectively. Therefore KBTA does not explicitly address the problem of functional test vector generation: however. it does attack a restricted form of vector generation for timing integrity which is described later in this paper.

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Copyright information

© Springer-Verlag Berlin Heidelberg 1986

Authors and Affiliations

  • Bryant W. York
    • 1
  1. 1.Digital Equipment CorporationHudsonUSA

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