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Tin pp 126-144 | Cite as

X-ray Fluorescence

  • R. Smith
Chapter
Part of the Handbuch der Analytischen Chemie / Handbook of Analytical Chemistry book series (HAC, volume 3 / 4 / 4a / 4a g)

Abstract

A number of different X-ray fluorescence instruments are in routine use:

(i) Crystal dispersion, tube excitation, sequential counting. (ii) Crystal dispersion, tube excitation, simultaneous counting. (iii) Crystal dispersion, electron excitation. (iv) Non-dispersive, Ross filter, radioisotope excitation. (v) Non-dispersive, semi-conductor detector.

Types (i) and (ii) are used in laboratories throughout the world and unless otherwise stated, any reference in this chapter will assume instruments of type (i). Instruments of type (iv) are also widely used but are rather more limited in their scope and tend to be used for well-defined applications. Type (iv) instruments may also be obtained as portable monitors and are used in prospecting, mining and on-line mineral dressing applications. Instruments of types (iii) and (v) are available commercially but have found few applications in the analysis of materials containing tin.

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References

  1. 1.
    Jenkins, R., De Vries, J.L.: Practical X-Ray Spectrometry, 2nd ed., London: McMillan 1969Google Scholar
  2. 2.
    Liebhafsky, H.A., Pfeiffer, H.G., Winslow, E.H., Zemany, P.D.: X-Ray Absorption and Emission in Analytical Chemistry New York: Wiley 1960Google Scholar
  3. 3.
    Jenkins, R.: Bulletin 79. 177/FS 29, Eindhoven: Philips (1970)Google Scholar
  4. 4.
    Unpublished Work and Standard Methods, Capper Pass, Ltd.Google Scholar
  5. 5.
    De Vries, J.L.: X-Ray Fluorescence Spectrometry -Review of Literature 7th ed., Eindhoven: Philips 1976Google Scholar
  6. 6.
    Sweatman, T.R., Wong, Y.C., Toong, K.S.: Trans. Inst. Min. Metall. 76B, 149 (1967)Google Scholar
  7. 7.
    Wong, Y.C., Seevaratnam, S.: Analyst 96, 562 (1971)CrossRefGoogle Scholar
  8. 8.
    Tertian, R., Geninasca, R.: X-Ray Spectrometry 1, 83 (1972)CrossRefGoogle Scholar
  9. 9.
    Sweatman, T.R., Norrish, K., Durie, R.: C.S.I.R.O. Div. C.al Res. Misc. Rept. 177 (1963)Google Scholar
  10. 10.
    Carr-Brion, K.G.: Analyst 89, 346 (1964)CrossRefGoogle Scholar
  11. 11.
    Carr-Brion, K.G.: Analyst 90, 9 (1965)CrossRefGoogle Scholar
  12. 12.
    Machacek, V.: Miner. Geol. 17, 171 (1971)Google Scholar
  13. 13.
    Lavrentev, Y.G.: Zavod. Lab. 35, 1118 (1969)Google Scholar
  14. 14.
    Avis, E., Carrigan, A., McNeil, I.: IUPAC Congress X XII (1969)Google Scholar
  15. 15.
    Harvey, P.K., Taylor, D.M., Hendry, R.D., Bancroft, F.: X-Ray Spectrometry 2, 33 (1973)CrossRefGoogle Scholar
  16. 16.
    Norrish, K., Hutton, J.T.: Geochim. Cosmochim. Acta 33, 431 (1969)CrossRefGoogle Scholar
  17. 17.
    Ingamells, C.O.: Anal. Chim. Acta 52, 323 (1970)CrossRefGoogle Scholar
  18. 18.
    Sear, L.G.: 8th Philips X-Ray Conference, Birmingham (1971)Google Scholar
  19. 19.
    Carr-Brion, K.G.: Analyst 89, 556 (1964)CrossRefGoogle Scholar
  20. 20.
    Payne, K. W.: Proc. 7th Philips X-Ray Conference, Durham (1970)Google Scholar
  21. 21.
    Payne, K.W.: 8th Philips X-Ray Conference, Birmingham (1972)Google Scholar
  22. 22.
    Lueschow, H.M., Schaefer, H.P.: Z. Anal. Chem. 250, 317 (1970)CrossRefGoogle Scholar
  23. 23.
    Sanner, G., Ehrhardt, H.: Neue Hütte 13, 751 (1968)Google Scholar
  24. 24.
    Ross, P.A.: J. Opt. Soc. Amer., Rev. Sci. Instrum. 16, 433 (1928)CrossRefGoogle Scholar
  25. 25.
    Bowie, S.H.U., Darnley, A.G., Rhodes, J.R.: Trans. Inst. Min. Metall. 74, 361 (1965)Google Scholar
  26. 26.
    Garson, M.S., Bateson, J.H.: Trans. Inst. Min. Metall. 76B, 165 (1967)Google Scholar
  27. 27.
    Cox, R.: Trans. Inst. Min. Metall. 77B, 109 (1968)Google Scholar
  28. 28.
    Gallagher, M.J.: Proc. 9th Commonwealth Min. Metall. Congr. 2, 691 (1969)Google Scholar
  29. 29.
    Nikitin, F. V., Kats, I.E.: Zavod. Lab. 36, 159 (1970)Google Scholar
  30. 30.
    Brunner, G., Dahn, E.: Isotopenpraxis 8, 300 (1972)Google Scholar
  31. 31.
    Nikitin, F.V.: Zavod. Lab. 31, 966 (1965)Google Scholar
  32. 32.
    Glade, G.H., Post, H.R.: Appl. Spectros. 22, 123 (1968)CrossRefGoogle Scholar
  33. 33.
    Glade, G.H., Post, H.R.: Appl. Spectros. 24, 193 (1970)CrossRefGoogle Scholar
  34. 34.
    Lumb, P.G.,: Proc. 7th Philips X-Ray Conference, Durham (1970)Google Scholar
  35. 35.
    Lumb, P.G.: Bulletin 7000.38.1700. 11, Eindhoven: Philips (1971)Google Scholar
  36. 36.
    Roussow, A.J.: S.Afr.Ind.Chem. 14, 44 (1960)Google Scholar
  37. 37.
    Zanin, S.J., Hooser, G.E.: Appl. Spectros. 22, 105 (1968)CrossRefGoogle Scholar
  38. 38.
    Fillmoore, C.L., Eckert, A.C., Scholle, J. V.: Appl. Spectros. 23, 502 (1969)CrossRefGoogle Scholar
  39. 39.
    Lueschow, H.M., Steil, H.U.: Z. Anal. Chem. 245, 304 (1969)CrossRefGoogle Scholar
  40. 40.
    Lumb, P.G.: Metallurgia 80, 127 (1969)Google Scholar
  41. 41.
    Bareham, R.F., Fox, J.G.M.: J.Inst.Metals 88, 344 (1960)Google Scholar
  42. 42.
    Manners, V.J., Craig, J.V., Scott, F.H.: J.Inst.Metals 95, 173 (1967)Google Scholar
  43. 43.
    Jenkins, R., De Klerck, J., Van Gelder, S.: Bulletin 7000.38.0310. 11 Eindhoven: Philips (1971)Google Scholar
  44. 44.
    Thiele, B.: Siemens Z. 44, 707 (1970)Google Scholar
  45. 45.
    Cullen, T.J.: Dev.Appl.Spectros. 1, 25 (1962)CrossRefGoogle Scholar
  46. 46.
    Brill, M., Faust, W.: Z. Anal. Chem. 258, 349 (1972)CrossRefGoogle Scholar
  47. 47.
    Barbier, M., Rondeau, J.M.: Chim. Anal. 53, 470 (1971)Google Scholar
  48. 48.
    Tunney, A.A., Hughes, H.: Brit. Steel Corp. Open Rept. GS/TECH/240/1/71/C (1971)Google Scholar
  49. 49.
    Griffiths, J.M., Whitehead, H.R.: N.P.L. Rept. Chem. 16 (1972)Google Scholar
  50. 50.
    Tunney, A.A.: Brit. Steel Corp.Open Rept. GS/EX/22/73/C (1973)Google Scholar
  51. 51.
    Tunney, A.A.: Brit. Steel Corp.Open Rept. GS/EX/4/73/C (1973)Google Scholar
  52. 52.
    Campbell, W.J., Neylan, D.L.: Rept. Invest. U.S.Bur. Mines RI 7773 (1973)Google Scholar
  53. 53.
    Griffiths, J.M., Whitehead, H.R.: N.P.L.Rept.Chem. 17, (1972)Google Scholar
  54. 54.
    De Neef,J., Adams, F., Hoste, J.: Anal. Chim. Acta 62, 71 (1972)CrossRefGoogle Scholar
  55. 55.
    Porter, D.E., Woldseth, R.: Anal. Chem., 45, 60A (1973)Google Scholar
  56. 56.
    Hollstein, M., De Voe, J.R.: J. Radioanalyt. Chem. 6, 139 (1970)CrossRefGoogle Scholar
  57. 57.
    Suzuki, S., Matsumoto, S., Itoh, J.: Japan Analyst 19, 1523 (1970)CrossRefGoogle Scholar
  58. 58.
    Dick, J.G., Fraser, A.R.: Can.J.Spectros. 17, 135 (1972)Google Scholar
  59. 59.
    Matsumura, T., Kotani, N., Goto, T.: Japan Analyst 19, 1393 (1970)CrossRefGoogle Scholar
  60. 60.
    Vassilaros, G.L., McKaveney, J.P.: Talanta 16, 195 (1969)CrossRefGoogle Scholar
  61. 61.
    Percheron, A., Pinta, M.: Anal. Chim. Acta 42, 489 (1968)CrossRefGoogle Scholar
  62. 62.
    Sarian, S., Weart, H.W.: Anal. Chem. 35, 115 (1963)CrossRefGoogle Scholar
  63. 63.
    Bertin, E.P.: Anal. Chem. 38, 826 (1964)CrossRefGoogle Scholar
  64. 64.
    Havranek, E., Bumbalova, A., Kapinska, V.: Chemicky Prum. 20, 536 (1970); Anal.Abstr. 21, 1902 (1971)Google Scholar
  65. 65.
    Ishii, Y., Kawamura, H., Yagi, S.: Japan Analyst 17, 3 (1968)CrossRefGoogle Scholar
  66. 66.
    Wlotzka, F.: Z.Anal.Chem. 215, 81 (1966)CrossRefGoogle Scholar
  67. 67.
    Kobliska, J.J., Kodama, S.P., Eckhart, C.G., Gaydosh, R.J., McMeekin, L.J., Santacana, F., Prescott, W.B.: Paint Varn.Prod. 62, 27 (1972); Anal. Abstr. 24, 2269 (1973)Google Scholar
  68. 68.
    Chamberlain, B.R., Leech, R.J.: Talanta 14, 597 (1967)CrossRefGoogle Scholar
  69. 69.
    Nakanishi, H., Yoshimura, M., Yoshisako, K., Itsuki, K.: Japan Analyst 13, 1131 (1964)CrossRefGoogle Scholar
  70. 70.
    Lachance, C.R., Trail, R.J.: Can.J. Spectros. 11, 43 (1966)Google Scholar
  71. 71.
    Rasberry, S.D., Heinrich, K.F.J.: Anal. Chem. 46, 81 (1974)CrossRefGoogle Scholar

Copyright information

© Springer-Verlag Berlin Heidelberg 1978

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  • R. Smith

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