Verhandlungen pp 302-306 | Cite as

Low voltage electron microscopy

  • W. C. Nixon


Extremely high electron accelerating voltages have been tried in the past in attempts to see internal detail in biological specimens up to 1 μ thick. In addition there is a slight theoretical gain in resolution as the voltage is raised. These two reasons have led to instruments for 220 kV, (1), 300 kV, (2), 400 kV, (3) and 1400 kV (4) among others. The advent of the ultra-microtome in various forms, capable of cutting sections 0.01 μ thick, has eliminated the need for penetration. The improvement in resolution has never been demonstrated since the contrast falls more rapidly as the voltage is raised. At present there is a need to follow the converse of past work and investigate the region below 10 kV for electron microscopy. The resolving power of the instrument will deteriorate only slightly while the gain in contrast may actually improve the overall resolution for a given thin section.


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  1. 1.
    Müller, H. O., and E. Ruska: Kolloid-Z. 95, 21 (1941).CrossRefGoogle Scholar
  2. 2.
    Zworykin, V. K., J. Hillier, and A. W. Vance: J. appl. Physics 12, 738 (1941).ADSCrossRefGoogle Scholar
  3. 3.
    Dorsten, A. C. Van, W. J. Oosterkamp, and J. B. LE Poole: Philips techn. Rev. 9, 193 (1947).Google Scholar
  4. 4.
    Marton, L.: Electron Mic. Conference, Cambridge 1948, quoted in (5), 269.Google Scholar
  5. 5.
    Cosslett, V. E.: Practical Electron Microscopy. p. 104. London: Butterworths 1951.Google Scholar
  6. 6.
    Cosslett, V. E.: Proc. Phys. Soc. 58, 443 (1946).Google Scholar
  7. 7.
    Knoll, M.: Electron Physics Conference, Washington, 1951, Nat. Bur. Stands. Circ. 527, 329 (1954).Google Scholar
  8. 8.
    Cosslett, V. E.: Les Techniques Récentes en Microscopie Electronique. C.N.R.S., Toulouse Conf., p. 44, 1955.Google Scholar
  9. 9.
    Hall, C. E.: Introduction to Electron Microscopy. p. 301. New York: McGraw-Hill 1953.Google Scholar
  10. 10.
    Haine, M. E.: Intensification of the Electron Microscope Image. J. Phot. Sci. 1958 (in the press).Google Scholar
  11. 11.
    Feldman, C., and M. O’hara J opt. Soc. Amer. 47, 300 (1957).ADSCrossRefGoogle Scholar
  12. 12.
    Pattee, H. H.: Science 128, 977 (1958).ADSCrossRefGoogle Scholar
  13. 13.
    Valentine, R. C.: Nature (Lond.) 181, 832 (1958).ADSCrossRefGoogle Scholar
  14. 14.
    Oberlin, A., and C. Tchodbar: Programme of this Conference, Abstract 15.06 (no lecture).Google Scholar
  15. 15.
    Drechsler, M., V. E. Cosslett, and W. C. Nixon: This vol. p. 13Google Scholar
  16. 16.
    Valentine, R. C.: Private Communication 1958.Google Scholar
  17. 17.
    Siegel, B. M., and K. C. Knowlton: X-ray microscopy and microradiography Proc. Cambridge Symposium 1956. Academic Press N. Y. p. 106 (1957).Google Scholar

Copyright information

© Springer-Verlag Berlin Heidelberg 1960

Authors and Affiliations

  • W. C. Nixon
    • 1
  1. 1.Cavendish LaboratoryUniversity of CambridgeEngland

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