Verhandlungen pp 249-253 | Cite as

X-ray microscopy using point sources

  • W. C. Nixon


The methods of projection X-ray microscopy have developed from the same physical basis of electron optics as employed in electron microscopy. The production and control of this type of finely focused electron beam is common as well to the scanning electron microscope, the double condenser lens system, accurate selected area electron diffraction and working materials on the microscope. The applications of X-ray microscopy are similar to those of electron microscopy at lower resolution but with the unique advantage of precise chemical analysis of small selected regions of the specimen. These two areas of common interest justify the inclusion of some recent work on X-ray microscopy within the scope of this conference. A symposium on this subject was held at Cambridge, England in 1956 and the published proceedings (1) give a complete record of all the known work on X-ray microscopy and microradiography up to that time. Two more recent instrumental results are discussed here prior to the next meeting on X-ray microscopy at Stockholm in 1959.


Unable to display preview. Download preview PDF.

Unable to display preview. Download preview PDF.


  1. 1.
    X-ray Microscopy and Microradiography”. Proc. Cambridge Symposium, 1956. Eds. Cosslett, Engström, and Pattee. New York: Academic Press 1957.Google Scholar
  2. 2.
    Pattee, H. H.: Science 128, 977 (1958).ADSCrossRefGoogle Scholar
  3. 3.
    Ong Sing Poen and J. B. Lepoole: Appl. Sci. Res. B 7, 233 (1958).CrossRefGoogle Scholar

Copyright information

© Springer-Verlag Berlin Heidelberg 1960

Authors and Affiliations

  • W. C. Nixon
    • 1
  1. 1.Cavendish LaboratoryUniversity of CambridgeEngland

Personalised recommendations