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Verhandlungen pp 169-170 | Cite as

A two-stage electron microscope using a pointed filament

  • T. Hibi
  • S. Takahashi
Chapter

Abstract

As it is easier to reduce aberrations due to imperfect alignment in a two-stage electron microscope than in a three-stage microscope, it was our intention to achieve a higher resolution with an ordinary two-stage electron microscope using an improved pointed filament and electron lenses having adequately short focal lengths. The HU-6 of Hitachi (old type) was used as test electron microscope. Its maximum electron-optical magnification is 15000, its design is very simple, and it allows various experiments to be carried out, because all its parts can be dismounted.

References

  1. 1.
    Hibi, T.: J. Electron Microscopy 4, 10 (1956).Google Scholar
  2. 2.
    Sakaki, Y., u. G. Möllenstedt: Optik 13, 193 (1956).Google Scholar
  3. 3.
    Pashley, D. W., J. W. Menter und G. A. Bassett: Nature (Lond.) 179, 752 (1957).ADSCrossRefGoogle Scholar
  4. 4.
    Hibi, T., und K. Vada: Physik. Verh. 8, 224 (1957).Google Scholar

Copyright information

© Springer-Verlag Berlin Heidelberg 1960

Authors and Affiliations

  • T. Hibi
    • 1
  • S. Takahashi
    • 1
  1. 1.Research Institute for Scientific MeasurementTohoku UniversitySendaiJapan

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