Some aspects of glial function as revealed by electron microscopy
The structural analysis of the central nervous system, with the so-called selective histological techniques, is hindered by the fact that only partial views of the total organization are obtained. Thus the methods for the demonstration of astroglia, oligodendroglia, microglia, myelin sheaths, Nissl substance and so forth, emphasize only one component at the time and do not permit a spatial integration of all the structural elements. On the contrary, with the electron microscope in thin sections fixed in osmium tetroxide, all these and other components can be visualized simultaneously and can be followed in their topographic relationships down to dimensions beyond the resolving power of the optical microscope.
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