A high temperature stage for the Elmiskop I

  • M. J. Whelan


High temperature examination of crystalline materials in the transmission electron microscope has not been extensively reported in the literature. A notable exception is the work of Takahashi et al. (1), which describes experiments carried out with a high temperature adaptor on a commercial Japanese instrument. In this work the size of the object chamber and the long focal length of the objective enabled a small electric furnace to be accommodated, dissipating a relatively large amount of heat. These workers reported that 120 W were required to heat the object to 1000° C.


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  1. 1.
    Takahashi, N., T. Takeyama, K. Ito, T. Iro, K. Mihama and M. Watanabe: J. Electron Microscopy (Jap.) 4, 16 (1956).Google Scholar
  2. 2.
    Schott, O., and S. Leisegang: Proc. Stockholm Conference on Electron Microscopy. Stockholm: Almqvist and Wlksell 1956, p. 27.Google Scholar

Copyright information

© Springer-Verlag Berlin Heidelberg 1960

Authors and Affiliations

  • M. J. Whelan
    • 1
  1. 1.Cavendish LaboratoryUniversity of CambridgeEngland

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