High temperature examination of crystalline materials in the transmission electron microscope has not been extensively reported in the literature. A notable exception is the work of Takahashi et al. (1), which describes experiments carried out with a high temperature adaptor on a commercial Japanese instrument. In this work the size of the object chamber and the long focal length of the objective enabled a small electric furnace to be accommodated, dissipating a relatively large amount of heat. These workers reported that 120 W were required to heat the object to 1000° C.
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