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Improvement of the specimen heating device for the electron microscope

  • I. Okazaki
  • M. Watanabe
  • K. Mihama
Chapter

Abstract

A specimen heating device for the electron microscope (1, 2) has previously been reported by us in detail, and some results (1, 2, 3, 4) were obtained applying this device. Recently, as the methods of preparing thin films of the specimen itself (5, 6, 7, 8) have made progresses, its utility has increased. But this specimen heating device for the electron microscope is not satisfactory in the following points.

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References

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    Takahashi, N., T. Takeyama, K. Ito, T. Ito; K. Mihama and M. Watanabe, and K. Mihama, and K. Ashinuma: J. Electronmicroscopy (Jap.) 6, 29 (1958).Google Scholar
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    Takahashi, N., K. Ashinuma and M. Watanabe: J. Electronmicroscopy (Jap.) 5, 22 (1957).Google Scholar

Copyright information

© Springer-Verlag Berlin Heidelberg 1960

Authors and Affiliations

  • I. Okazaki
    • 1
  • M. Watanabe
    • 1
  • K. Mihama
    • 1
  1. 1.Japan Electron Optics Lab. Co. Ltd.TokyoJapan

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