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A protection shutter for the specimen in the electron microscope

  • Nobuji Sasaki
  • Ryuzo Ueda
  • Noboru Arai
Chapter

Abstract

In electron microscopy, specimens under examination are inevitably subjected to the deteriorating action of the electron beam and change more or less in shape, chemical composition, and crystal structure. Contamination of specimens is also a result of the joint action of electrons and residual organic vapours. These problems have often been discussed and will gain in importance as the high magnification electron microscope becomes more popular. One way to minimize the deterioration would be to take the micrographs with a minimum dose of electrons by eliminating the necessity of focusing.

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Copyright information

© Springer-Verlag Berlin Heidelberg 1960

Authors and Affiliations

  • Nobuji Sasaki
    • 1
  • Ryuzo Ueda
    • 1
  • Noboru Arai
    • 1
  1. 1.Department of Chemistry, Faculty of ScienceKyoto UniversityJapan

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