The fringe patterns which occur in electron micrographs of overlapping thin crystals were first observed almost simultaneously but independently in 1951 by Mitsubishi, Nagasakiand Uyeda(1), by Hillier(2) and by one of us (J. L. F.) (2) and since then have been the subject of many investigations. In 1956 the present authors (3) showed that in the case of pairs of sufficiently thin crystals rotationally disoriented through a small angle e it should be possible to observe a complex of fringes, i. e., a moiré pattern, which is almost identical with the Patterson distribution of structure analysis. This paper describes the physical processes involved in the formation of moiré patterns and the possibility of observing patterns more directly related to the structure of the crystals than the Patterson function.
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- 1.Mitsuisxi, T., H. Nagasaki, and R. Uyeda: Proc. Imp. Acad. Japan 27, 86 (1951).Google Scholar
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