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ODMR of Defects in Semiconductors

  • J.-M. Spaeth
Conference paper

Abstract

The recent application of various methods of optical detection of electron paramagnetic resonance (ODEPR) and electron nuclear double resonance (ODENDOR) are reviewed and illustrated with examples from the study of III-V semiconductors.

PACS numbers

7670-r 61.70-r 

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Copyright information

© Springer-Verlag Berlin Heidelberg 1990

Authors and Affiliations

  • J.-M. Spaeth
    • 1
  1. 1.Fachbereich PhysikUniversität-GH PaderbornPaderbornFed. Rep. of Germany

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