Point Pattern Matching for 2-D Point Sets with Regular Structure

  • Tapio Manninen
  • Risto Rönkkä
  • Heikki Huttunen
Part of the Lecture Notes in Computer Science book series (LNCS, volume 6688)

Abstract

Point pattern matching (PPM) is a widely studied problem in algorithm research and has numerous applications, e.g., in computer vision. In this paper we focus on a class of brute force PPM algorithms suitable for situations where the state-of-the-art methods do not perform optimally, e.g., due to point sets with regular structure. We discuss of an existing algorithm, which is optimal in the sense of brute force testing of different point pairings. We propose a parameter choosing scheme that minimizes the memory consumption of the algorithm. We also present a modified version of the algorithm to overcome issues related to its implementation and accuracy. Due to its brute force nature, the algorithm is guaranteed to return the best possible result.

Keywords

Point Pattern Matching Computer Vision Printed Electronics 

References

  1. 1.
    Besl, P., McKay, H.: A method for registration of 3-D shapes. IEEE Trans. Pattern Anal. Machine Intell. 14(2), 239–256 (1992)Google Scholar
  2. 2.
    Carcassoni, M., Hancock, E.: Point pattern matching with robust spectral correspondence. In: Proc. IEEE Conf. on Comp. Vis. Pattern Recogn. vol. 1, pp. 649–655 (2000)Google Scholar
  3. 3.
    Chang, S., Cheng, F., Hsu, W., Wu, G.: Fast algorithm for point pattern matching: Invariant to translations, rotations and scale changes. Pattern Recogn. 30, 311–320 (1997)CrossRefGoogle Scholar
  4. 4.
    Chui, H., Rangarajan, A.: A new point matching algorithm for non-rigid registration. Comp. Vision and Image Understanding 89(2-3), 114–141 (2003)CrossRefMATHGoogle Scholar
  5. 5.
    Grimson, W.E.L., Lozano-Pérez, T.: Localizing overlapping parts by searching the interpretation tree. IEEE Trans. Pattern Anal. Machine Intell. 9(4), 469–482 (1987)CrossRefGoogle Scholar
  6. 6.
    Imai, H., Asano, T.: Finding the connected components and a maximum clique of an intersection graph of rectangles in the plane. Journal of Algorithms 4(4), 310–323 (1983)MathSciNetCrossRefMATHGoogle Scholar
  7. 7.
    Lavine, D., Lambird, B.A., Kanai, L.N.: Recognition of spatial point patterns. Pattern Recogn. 16(3), 289 (1983)CrossRefMATHGoogle Scholar
  8. 8.
    Li, B., Meng, Q., Holstein, H.: Point pattern matching and applications-a review. In: IEEE Intern. Conf. on Syst., Man and Cybern., vol. 1, pp. 729–736 (2003)Google Scholar
  9. 9.
    Manninen, T., Pekkanen, V., Rutanen, K., Ruusuvuori, P., Rönkkä, R., Huttunen, H.: Alignment of individually adapted print patterns for ink jet printed electronics. J. Imag. Sci. and Tech. 54(5), 050306 (2010)CrossRefGoogle Scholar
  10. 10.
    Miettinen, J., Pekkanen, V., Kaija, K., Mansikkamäki, P., Mäntysalo, J., Mäntysalo, M., Niittynen, J., Pekkanen, J., Saviauk, T., Rönkkä, R.: Inkjet printed system-in-package design and manufacturing. Elsevier Microelectr. J (2008)Google Scholar
  11. 11.
    Ranade, S., Rosenfeld, A.: Point pattern matching by relaxation. Pattern Recogn. 12(4), 269–275 (1980)CrossRefGoogle Scholar
  12. 12.
    Stockman, G.: Object recognition and localization via pose clustering. Comp. Vision, Graph. and Image Process. 40(3), 361–387 (1987)CrossRefGoogle Scholar
  13. 13.
    Stockman, G., Kopstein, S., Benett, S.: Matching images to models for registration and object detection via clustering. IEEE Trans. Pattern Anal. and Mach. Intell. PAMI-4, 229–241 (1982)CrossRefGoogle Scholar
  14. 14.
    Wamelen, P.B.V., Li, Z., Iyengar, S.S.: A fast expected time algorithm for the 2-d point pattern matching problem. Pattern Recogn. 37(8), 1699–1711 (2004)CrossRefGoogle Scholar
  15. 15.
    Wylie, C., Romney, G., Evans, D., Erdahl, A.: Half-tone perspective drawings by computer. In: Proc. Fall Joint Comp. Conf., pp. 49–58. ACM, New York (1967)Google Scholar

Copyright information

© Springer-Verlag Berlin Heidelberg 2011

Authors and Affiliations

  • Tapio Manninen
    • 1
  • Risto Rönkkä
    • 1
  • Heikki Huttunen
    • 2
  1. 1.DropAim OyTampereFinland
  2. 2.Tampere University of TechnologyTampereFinland

Personalised recommendations