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Intelligent Process Trend Recognition Fault Diagnosis and Industrial Application

  • Sien Lu
  • Biao Huang
Conference paper
Part of the Lecture Notes in Computer Science book series (LNCS, volume 4114)

Abstract

An intelligent process monitoring approach, which consists of process trend recognition and fault detection, is presented in this paper. This method incorporates wavelet transform, symbolic representation of data trend, pattern recognition, and Hidden Markov model (HMM) for intelligent reasoning. A simulation example and an industrial case study have shown the value of this approach.

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Copyright information

© Springer-Verlag Berlin Heidelberg 2006

Authors and Affiliations

  • Sien Lu
    • 1
  • Biao Huang
    • 1
  1. 1.Department of Chemical and Materials Engineering, University of Alberta, Edmonton, Alberta, T6G 2G6Canada

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