Advertisement

Typical Applications

  • Otwin Breitenstein
  • Wilhelm Warta
  • Martin C. Schubert
Chapter
Part of the Springer Series in Advanced Microelectronics book series (MICROELECTR., volume 10)

Abstract

Some applications of Lock-in Thermography for the investigation of a thermally thin sample (solar cell) and a thermally thick one (IC) were already presented in the examples given in Chap.  5. In the following section we will present some more applications, showing the universal applicability of this technique to different fields of functional diagnostics of electronic components.

Copyright information

© Springer Nature Switzerland AG 2018

Authors and Affiliations

  • Otwin Breitenstein
    • 1
  • Wilhelm Warta
    • 2
  • Martin C. Schubert
    • 2
  1. 1.Max Planck Institute of Microstructure PhysicsHalleGermany
  2. 2.Fraunhofer Institute for Solar Energy SystemsFreiburgGermany

Personalised recommendations