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Physical and Technical Basics

  • Otwin BreitensteinEmail author
  • Wilhelm Warta
  • Martin C. Schubert
Chapter
Part of the Springer Series in Advanced Microelectronics book series (MICROELECTR., volume 10)

Abstract

First, in Sect. 2.1 the general basics of infrared (IR) thermography are briefly reviewed, which are also applicable to IR camera based lock-in thermography. In Sect. 2.2, the principles of the lock-in technique itself and of its digital realization are described.

Copyright information

© Springer Nature Switzerland AG 2018

Authors and Affiliations

  • Otwin Breitenstein
    • 1
    Email author
  • Wilhelm Warta
    • 2
  • Martin C. Schubert
    • 2
  1. 1.Max Planck Institute of Microstructure PhysicsHalleGermany
  2. 2.Fraunhofer Institute for Solar Energy SystemsFreiburgGermany

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