Microscopic Investigation by Phase Contrast Imaging and Surface Spreading Resistance Mapping
This paper explores the microscopic investigations of thin films using less explored Scanning Probe Microscopy (SPM) modes viz. Phase Contrast Microscopy (Phase Imaging) and Scanning Spreading Resistance Microscopy (SSRM). The contrast in Phase imaging has been corroborated with the region of different resistance using SSRM.
KeywordsPhase imaging SSRM AFM Tapping mode
The authors acknowledge Director SSPL for his continuous support and for the permission to publish this work. Help from other colleagues are also acknowledged.
- 3.S.B. Kuntze, D. Banin, E.H. Sargent, St. J. Dixon-Warren, J.K. White, K. Hinzer, Solid state and materials sciences. 30, 71–124 (2005)Google Scholar