Microscopic Investigation by Phase Contrast Imaging and Surface Spreading Resistance Mapping

  • Akhilesh PandeyEmail author
  • Garima
  • Ashok K. Kapoor
Conference paper
Part of the Springer Proceedings in Physics book series (SPPHY, volume 215)


This paper explores the microscopic investigations of thin films using less explored Scanning Probe Microscopy (SPM) modes viz. Phase Contrast Microscopy (Phase Imaging) and Scanning Spreading Resistance Microscopy (SSRM). The contrast in Phase imaging has been corroborated with the region of different resistance using SSRM.


Phase imaging SSRM AFM Tapping mode 



The authors acknowledge Director SSPL for his continuous support and for the permission to publish this work. Help from other colleagues are also acknowledged.


  1. 1.
    G. Binnig, C.F. Quate, C. Gerber, Atomic force microscope. Phys. Rev. Lett. 56, 930–933 (1986)ADSCrossRefGoogle Scholar
  2. 2.
    G.K. Pang, K.Z. Baba-Kishi, A. Patel, Ultramicroscopy 81, 35–40 (2000)CrossRefGoogle Scholar
  3. 3.
    S.B. Kuntze, D. Banin, E.H. Sargent, St. J. Dixon-Warren, J.K. White, K. Hinzer, Solid state and materials sciences. 30, 71–124 (2005)Google Scholar
  4. 4.
    A. Schulze, R. Cao, P. Eyben, T. Hantschel, W. Vandervorst, Ultramicroscopy 161, 59–65 (2016)CrossRefGoogle Scholar

Copyright information

© Springer Nature Switzerland AG 2019

Authors and Affiliations

  1. 1.Solid State Physics LaboratoryTimarpurIndia

Personalised recommendations