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Microscopic Investigation by Phase Contrast Imaging and Surface Spreading Resistance Mapping

  • Akhilesh PandeyEmail author
  • Garima
  • Ashok K. Kapoor
Conference paper
Part of the Springer Proceedings in Physics book series (SPPHY, volume 215)

Abstract

This paper explores the microscopic investigations of thin films using less explored Scanning Probe Microscopy (SPM) modes viz. Phase Contrast Microscopy (Phase Imaging) and Scanning Spreading Resistance Microscopy (SSRM). The contrast in Phase imaging has been corroborated with the region of different resistance using SSRM.

Keywords

Phase imaging SSRM AFM Tapping mode 

Notes

Acknowledgements

The authors acknowledge Director SSPL for his continuous support and for the permission to publish this work. Help from other colleagues are also acknowledged.

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Copyright information

© Springer Nature Switzerland AG 2019

Authors and Affiliations

  1. 1.Solid State Physics LaboratoryTimarpurIndia

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