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Photoluminescence Imaging of Silicon Wafers and Solar Cells for Process, Device Development and Diagnostics

  • Ashok K. SharmaEmail author
  • Manoj K. Ramanathi
  • Binny Nair
  • Tarun S. Yadav
  • Prabir K. Basu
  • Anil Kottantharayil
  • K. L. Narasimhan
  • B. M. Arora
Conference paper
Part of the Springer Proceedings in Physics book series (SPPHY, volume 215)

Abstract

Photoluminescence (PL) imaging has emerged as an important tool for obtaining the spatial variation of the electronic and electrical parameters of Si wafer and solar cells. Since this is a contactless measurement, spatial lifetime maps can be obtained at different stages of processing. This paper consists of two parts. In the first part we describe a low cost PL imaging tool developed at NCPRE. Improvements in image quality using both hardware and software approaches will be presented. In the second part, we present various case studies of how processing affects minority carrier lifetime and series resistance.

Notes

Acknowledgements

The authors would like to acknowledge support received by the National Centre for Photovoltaic Research and Education (NCPRE) through funding from the Ministry of New and Renewable Energy (MNRE), Government of India.

References

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Copyright information

© Springer Nature Switzerland AG 2019

Authors and Affiliations

  • Ashok K. Sharma
    • 1
    Email author
  • Manoj K. Ramanathi
    • 2
  • Binny Nair
    • 2
  • Tarun S. Yadav
    • 2
  • Prabir K. Basu
    • 1
  • Anil Kottantharayil
    • 2
  • K. L. Narasimhan
    • 2
  • B. M. Arora
    • 2
  1. 1.National Centre for Photovoltaic Research & Education (NCPRE)Indian Institute of Technology BombayMumbaiIndia
  2. 2.Department of Electrical Engineering (EE)Indian Institute of Technology BombayMumbaiIndia

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