Characterization of Textured Structures

  • Hiroyuki FujiwaraEmail author
  • Yuichiro Sago
Part of the Springer Series in Optical Sciences book series (SSOS, volume 214)


Various textured structures have been incorporated into photovoltaic devices to improve the short-circuit current density based on optical confinement effects. Although intense light scattering occurs in textured structures, spectroscopic ellipsometry (SE) characterization can still be made even for textured single crystalline Si (c-Si) having a pyramid size of ~10 μm. Depending on the texture size, however, different measurements and analytical approaches need to be used. It has been demonstrated that high-precision SE characterization of submicron-size rough structures can be carried out by employing advanced optical models, including (i) effective-medium-approximation multilayer model and (ii) surface area model. From such SE analyses, structural non-uniformities in large-area solar cell modules can further be determined. In this chapter, we review SE characterization performed for textured structures in c-Si heterojunction, Si thin-film and Cu(In,Ga)Se2 solar cells.


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Copyright information

© Springer International Publishing AG, part of Springer Nature 2018

Authors and Affiliations

  1. 1.Gifu UniversityGifuJapan

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