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Sensitivity of Lumped Parameters to Geometry Changes in Finite Element Models

  • Sebastian SchuhmacherEmail author
  • Carsten Potratz
  • Andreas Klaedtke
  • Herbert De Gersem
Conference paper
Part of the Mathematics in Industry book series (MATHINDUSTRY, volume 28)

Abstract

The functional behavior of an electronic device is represented by an idealized circuit. Undesired parasitic interactions, such as electromagnetic-compatibility (EMC) problems, are modeled by additional lumped elements in the circuit. Device design parameters, e.g. partial inductances, must be optimized to improve EMC. This paper presents a sensitivity analysis method which relates changes to circuit parameters to changes to 3D model parameters.

Notes

Acknowledgements

The π-filter model used in Sect. 4.3.3 was kindly provided by Dr. Christoph Keller, Robert Bosch GmbH (CR/ARE1).

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Copyright information

© Springer International Publishing AG, part of Springer Nature 2018

Authors and Affiliations

  • Sebastian Schuhmacher
    • 1
    Email author
  • Carsten Potratz
    • 1
  • Andreas Klaedtke
    • 1
  • Herbert De Gersem
    • 2
  1. 1.Robert Bosch GmbH - Corporate ResearchRenningenGermany
  2. 2.TU DarmstadtDarmstadtGermany

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