Thermal Behaviour of Ge.25Te.60Se.15 Investigated by Emanation Thermal Analisis and DTA
The ternary sample of semiconductor glass Ge .25Te .60Se15 labeled by trace amount of Th, has been investigated by emanation thermal analisis (ETA) and DTA. The ETA results confirm the difference in the processes of struc ture formation of glassy or crystallin solids for thermal methods at various cooling rate. The Netzsch apparatus for ETA-DTA enables to us study the thermal behaviour of the samples. The possibility of the ETA is shown to distinguish various disorder stages.
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