Comparative Analysis of Impacts on Voltage Stability for Electrical Loading Loading in IEEE-14 Bus System

  • Pawan Kumar KushwahaEmail author
  • Priyanka Ray
  • Chayan Bhattacharjee
Conference paper
Part of the Learning and Analytics in Intelligent Systems book series (LAIS, volume 12)


This paper presents a study of the impact of the electrical load on the IEEE-14 bus system voltage stability (VS) under different system operating condition. For voltage stability assessment of a given operating point, various types of voltage stability indices (VSIs) have been proposed in the literature. In this paper, voltage stability of IEEE-14 bus test system is done for the impact of constant impedance, constant current and constant power loads (ZIP) load on voltage stability under normal condition, single line to ground fault (SLG), one generation tripped (OGT) and one line tripped (OLT). The results show various VSI magnitude with respect to line, the effect of loading on VS, the effect of SLG on VS, the effect of OGT on VS and effect of OLT on VS. Some important system operating conditions which are not considered in the literature are analyzed in this paper. These are helpful in practical situations for VS assessment of a particular line.


Voltage stability indices (VSIs) Voltage stability (VS) Single line to ground fault (SLG) One generation tripped (OGT) One line tripped (OLT) 



Authors like to thank TEQIP-III and Electrical Engineering Department for necessary support/funding for presenting this work.


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Copyright information

© Springer Nature Switzerland AG 2020

Authors and Affiliations

  • Pawan Kumar Kushwaha
    • 1
    Email author
  • Priyanka Ray
    • 1
  • Chayan Bhattacharjee
    • 1
  1. 1.Department of Electrical EngineeringN.I.TSilcharIndia

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