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Validation of Simulation Results on Coupled Problems

  • Rick JanssenEmail author
  • Renaud Gillon
  • Aarnout Wieers
  • Frederik Deleu
  • Hervé Guegnaud
  • Pascal Reynier
  • Wim Schoenmaker
  • E. Jan W. ter Maten
Chapter
Part of the Mathematics in Industry book series (MATHINDUSTRY, volume 29)

Abstract

The Test Set for the Power-MOS Devices and RF-Circuitry, as described in Chapter [11], and the Measurements for RF-Amplifiers, Bond Wire Fusing and MOS Power Cells (see Chapter [18]) were used to validate simulation results of coupled problems by comparing with measurements, as well as by comparing to outcomes with other simulation tools (when possible, mostly without full coupling).

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Copyright information

© Springer Nature Switzerland AG 2019

Authors and Affiliations

  • Rick Janssen
    • 1
    Email author
  • Renaud Gillon
    • 2
  • Aarnout Wieers
    • 2
  • Frederik Deleu
    • 2
  • Hervé Guegnaud
    • 3
  • Pascal Reynier
    • 3
  • Wim Schoenmaker
    • 4
  • E. Jan W. ter Maten
    • 5
  1. 1.NXP SemiconductorsEindhoventhe Netherlands
  2. 2.ON Semiconductor Belgium BVBAOudenaardeBelgium
  3. 3.ACCO SemiconductorLouveciennesFrance
  4. 4.MAGWEL NVLeuvenBelgium
  5. 5.Bergische Universität WuppertalWuppertalGermany

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