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Test Cases for Power-MOS Devices and RF-Circuitry

  • Rick JanssenEmail author
  • Renaud Gillon
  • Aarnout Wieers
  • Frederik Deleu
  • Hervé Guegnaud
  • Pascal Reynier
  • Wim Schoenmaker
  • E. Jan W. ter Maten
Chapter
Part of the Mathematics in Industry book series (MATHINDUSTRY, volume 29)

Abstract

This chapter gives an overview of realistic test cases, provided by industrial partners, for validation of the simulation tools, that were developed in the last years. They allowed to compare the results of measurements and simulations for real-life size applications.

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Copyright information

© Springer Nature Switzerland AG 2019

Authors and Affiliations

  • Rick Janssen
    • 1
    Email author
  • Renaud Gillon
    • 2
  • Aarnout Wieers
    • 2
  • Frederik Deleu
    • 2
  • Hervé Guegnaud
    • 3
  • Pascal Reynier
    • 3
  • Wim Schoenmaker
    • 4
  • E. Jan W. ter Maten
    • 5
  1. 1.NXP SemiconductorsEindhoventhe Netherlands
  2. 2.ON Semiconductor Belgium BVBAOudenaardeBelgium
  3. 3.ACCO SemiconductorLouveciennesFrance
  4. 4.MAGWEL NVLeuvenBelgium
  5. 5.Bergische Universität WuppertalWuppertalGermany

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