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Circuit Techniques for BTI and EM Accelerated and Active Recovery

  • Xinfei Guo
  • Mircea R. Stan
Chapter

Abstract

In the previous chapters we saw that both BTI and EM recovery can be activated and accelerated; these unique recovery behaviors can benefit future resilient digital systems if they are instrumented on chip. In this chapter, we discuss a set of circuit blocks that implement the required functionality for achieving accelerated and active self-healing on chip. Examples of such portable circuit IP blocks are negative voltage generators, reconfigurable heaters, wearout-aware power gating, bidirectional-current PDNs, and novel types of BTI and EM sensors. We present design details, functionality, and potential costs of each type of circuit. By implementing all or a subset of these circuit IPs, recovery can be enabled on chip with acceptable hardware costs.

Keywords

On-chip healing Recovery circuits BTI sensing EM sensing Novel PDN Reconfigurable heaters 

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Copyright information

© Springer Nature Switzerland AG 2020

Authors and Affiliations

  • Xinfei Guo
    • 1
  • Mircea R. Stan
    • 1
  1. 1.University of VirginiaCharlottesvilleUSA

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