Advertisement

Visualization and Chemical Analysis of Bitumen Microstructures

  • Xiaohu LuEmail author
  • Peter Sjövall
  • Hilde Soenen
  • Johan Blom
  • Martin Andersson
Conference paper
Part of the RILEM Bookseries book series (RILEM, volume 20)

Abstract

Microstructures of bitumen were investigated using atomic force microscopy (AFM) and environmental scanning electron microscopy (ESEM), and a chemical characterization was successfully carried out using time-of-flight secondary ion mass spectrometry (TOF-SIMS). The bee structures were observed by AFM, for which a chemical explanation by wax was confirmed by the TOF-SIMS analysis. A tube pattern or worm structures were generated and visualized by ESEM on bitumen surfaces. Chemical differences between the structured and unstructured areas, as well as between different areas of the structure, were observed. A mechanism for the structure formation on bitumen surface during ESEM analysis is suggested.

Keywords

Bitumen structure AFM ESEM TOF-SIMS 

References

  1. Blom, J., Soenen, H., Katsiki, A., Van den Brande, N., Rahier, H., van den Bergh, W.: Investigation of the bulk and surface microstructure of bitumen by atomic force microscopy. Constr. Build. Mater. 177, 158–169 (2018)CrossRefGoogle Scholar
  2. Hung, A.M., Fini, E.H.: AFM study of asphalt binder “bee” structures: origin, mechanical fracture, topological evolution, and experimental artifacts. RSC Adv. 5, 96972–96982 (2015)CrossRefGoogle Scholar
  3. Lu, X., Sjövall, P., Soenen, H.: Structural and chemical analysis of bitumen using time-of-flight secondary ion mass spectrometry (TOF-SIMS). Fuel 199, 206–218 (2017)CrossRefGoogle Scholar
  4. Lu, X., Sjövall, P., Soenen, H., Andersson, M.: Microstructures of bitumen observed by environmental scanning electron microscopy (ESEM) and chemical analysis using time-of-flight secondary ion mass spectrometry (TOF-SIMS). Fuel 229, 198–208 (2018)CrossRefGoogle Scholar
  5. Stokes, D.J.: Principles and Practice of Variable Pressure/Environmental Scanning Electron Microscopy (VP-ESEM). Wiley, Chichester (2008)CrossRefGoogle Scholar

Copyright information

© RILEM 2019

Authors and Affiliations

  • Xiaohu Lu
    • 1
    Email author
  • Peter Sjövall
    • 3
  • Hilde Soenen
    • 2
  • Johan Blom
    • 4
  • Martin Andersson
    • 5
  1. 1.Nynas ABNynäshamnSweden
  2. 2.RISE Research Institutes of SwedenBoråsSweden
  3. 3.Nynas NVAntwerpBelgium
  4. 4.Antwerp UniversityAntwerpBelgium
  5. 5.RISEStockholmSweden

Personalised recommendations