Application of Transmission Electron Microscopy to Studies of Relative Interfacial Energies in Solids
In the transmission electron microscope, interface junctions were observed at high magnification with the additional advantage of great depth of focus. The resulting three-dimensional nature of electron micrographs, combined with appropriate procedures of selected area diffraction, permits precise determination of relative interfacial energies. At the present time, the techniques described in this paper have been applied only to metallic solids. However, the results already obtained are so encouraging that similar studies of ceramic interfaces are very desirable.
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- 3.J. Washburn, R.B. Shaw, T. L. Johnston, R. J. Stokes, and E.R. Parker, Univ. of California 14th Tech. Rept. No. 27, 1956.Google Scholar
- 4.M.C. Inman and H.R. Tipler, Met. Rev. Inst. Metals 8: 105 (1963).Google Scholar
- 7.M. C. Inman, L. E. Murr, and A. R. Khan, (to be published).Google Scholar