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Application of Transmission Electron Microscopy to Studies of Relative Interfacial Energies in Solids

  • M. C. Inman
  • Max Paulus
Conference paper
Part of the Materials Science Research book series (MSR)

Abstract

In the transmission electron microscope, interface junctions were observed at high magnification with the additional advantage of great depth of focus. The resulting three-dimensional nature of electron micrographs, combined with appropriate procedures of selected area diffraction, permits precise determination of relative interfacial energies. At the present time, the techniques described in this paper have been applied only to metallic solids. However, the results already obtained are so encouraging that similar studies of ceramic interfaces are very desirable.

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References

  1. 1.
    H.U. Astrom, Acta Met. 4: 562 (1956).CrossRefGoogle Scholar
  2. 2.
    W.W. Mullins, Acta Met. 4: 421 (1956).CrossRefGoogle Scholar
  3. 3.
    J. Washburn, R.B. Shaw, T. L. Johnston, R. J. Stokes, and E.R. Parker, Univ. of California 14th Tech. Rept. No. 27, 1956.Google Scholar
  4. 4.
    M.C. Inman and H.R. Tipler, Met. Rev. Inst. Metals 8: 105 (1963).Google Scholar
  5. 5.
    M. C. Inman and A.R. Khan, Phil. Mag. 6: 937 (1961).CrossRefGoogle Scholar
  6. 6.
    R. L. Fullman, J. Appl. Phys. 22: 448 (1951).CrossRefGoogle Scholar
  7. 7.
    M. C. Inman, L. E. Murr, and A. R. Khan, (to be published).Google Scholar

Copyright information

© Springer Science+Business Media New York 1966

Authors and Affiliations

  • M. C. Inman
    • 1
  • Max Paulus
    • 2
  1. 1.Pennsylvania State UniversityUniversity ParkUSA
  2. 2.Centre National de la Recherche ScientifiqueBellevueFrance

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