Semi-Discrete Finite Element Method Analysis of Microstrip Structures
Numerical modeling and characterization of passive components for Microwave and Millimeter-wave Integrated Circuit (MMIC) applications is an active area of research at the present time. The requirements of versatility, accuracy and computational efficiency have been met only partially by the existing numerical solutions. Therefore these issues continue to motivate the development of new numerical techniques for MMIC component characterization.
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- 2.R. Pregla and W. Pascher, “The Method of Lines”, Ch. 6, Numerical Techniques for Microwave and Millimeterwave Passive Structures, T. Itoh, ed., New York: Wiley Interscience, 1989.Google Scholar
- 3.M. Davidovitz and Z. Wu, “Semi-Discrete Finite Element Method Analysis of Arbitrary Microstrip Elements — Static Solution”, submitted to IEEE Trans. on Microwave Theory Tech., Aug. 1990.Google Scholar
- 4.Z. Wu and M. Davidovitz, “Capacitance of Microstrip Lines on Anisotropic Substrate using the Semi-Discrete FEM Analysis”, submitted for review in International Journal on MIMICAE, Sept. 1990.Google Scholar
- 5.M. Davidovitz, “Calculations of Multi-Conductor Microstrip Line Capacitances Using the Semi-Discrete Finite-Element Method”, to be published in IEEE Microwave and Guided-Wave Letters, Jan. 1991.Google Scholar
- 6.M. Horno, “Quasi-static Characteristics of Covered Coupled Microstrips on Anisotropic Substrates: Spectral and Variational Analysis”, IEEE Trans. Microwave Theor. Techniques, MTT-30, pp. 1888–1892, Nov. 1982.Google Scholar