Study of Exciton Dephasing in Superlattices using Resonant Raman Spectroscopy

  • A. J. Shields
  • M. Cardona
Part of the NATO ASI Series book series (NSSB, volume 330)

Abstract

Inelastic scattering of light in semiconductors occurs via a process involving electronic excitations as intermediate states. This has facilitated the study of electronic properties through measurement of the Raman intensity as a function of the photon energy, known as the resonance Raman profile (RRP) [1]. Maxima in the RRP occur when either the incident or scattered photon energy equals that of an electronic transition, situations referred to as incoming and outgoing resonance, respectively. Resonances in the Raman scattering efficiency of semiconductor superlattices (SLs) have been observed due to transitions between the valence and conduction subbands [2,3].

Keywords

Applied Bias Raman Intensity Exciton Peak Dephasing Time Homogeneous Linewidth 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

Preview

Unable to display preview. Download preview PDF.

Unable to display preview. Download preview PDF.

References

  1. [1]
    For a review of resonance Raman studies in bulk semiconductors, see M. Cardona, in Light Scattering in Solids II, edited by M. Cardona and G. Güntherodt (Springer, Berlin, 1982); resonance effects in SLs are covered by J. Menendez, J. Luminescence 44, 285 (1989).CrossRefGoogle Scholar
  2. B. Jusserand and M. Cardona, in Light Scattering in Solids V, edited by M. Cardona and G. Güntherodt (Springer, Berlin, 1989).Google Scholar
  3. [2]
    J.E. Zucker, A. Pinczuk, D.S. Chemla, A. Gossard and W. Wiegmann, Phys.Rev.Lett 51, 1293 (1983)ADSCrossRefGoogle Scholar
  4. [3]
    A.J. Shields, M. Cardona, R. Nötzel and K. Ploog, Phys. Rev. B 46, 10490 (1992)ADSCrossRefGoogle Scholar
  5. [4]
    A.J. Shields, C. Trallero-Giner, M. Cardona, H.T. Grahn, K. Ploog, V.A. Haisler, D.A. Tenne, N.T. Moshegov and A.I. Toropov, Phys. Rev. B 46, 6990 (1992)ADSCrossRefGoogle Scholar
  6. [5]
    A.J. Shields, V.A. Haisler, C. Trallero-Giner and M. Cardona, Proc. of NATO ARW on Phonons in Heterostructures, St Feliu de Guixols, Spain (15–18 Sept. 1992)Google Scholar
  7. [6]
    C. Weisbuch, R. Dingle, A.C. Gossard and W. Weigmann, Solid State Comm. 38, 709 (1981)ADSCrossRefGoogle Scholar
  8. [7]
    J.E. Zucker, A. Pinczuk, D.S. Chemla and A. Gossard, Phys.Rev.B 35, 2892 (1987)ADSCrossRefGoogle Scholar
  9. [8]
    J. Hegarty, L. Goldner and M.D. Sturge, Phys.Rev.B 30, 7346 (1984)ADSCrossRefGoogle Scholar
  10. [9]
    M.B. Webb, S.T. Cundiff and D.G. Steel, Phys.Rev.B 43, 12658 (1991)ADSCrossRefGoogle Scholar
  11. [10]
    T. Takagahara, Phys.Rev.B 32, 7013 (1985)ADSCrossRefGoogle Scholar
  12. [11]
    A.J. Shields, G.O. Smith, E. Mayer, R. Eccleston, J. Kuhl, M. Cardona and K. Ploog, to be published in Phys. Rev. B.Google Scholar
  13. [12]
    J. Hegarty, M.D. Sturge, C. Weisbuch, A.C. Gossard and W. Wiegmann, Phys.Rev.Lett 49, 930 (1982)ADSCrossRefGoogle Scholar
  14. [13]
    L. Schultheis, J. Kuhl, A. Honold and C.W. Tu, Phys.Rev.B 34, 9027 (1986)ADSCrossRefGoogle Scholar
  15. [14]
    R. Eccleston, B.F. Feuerbacher, J. Kuhl, W.W. Rühle and K. Ploog, Phys.Rev.B 45, 11403 (1992)ADSCrossRefGoogle Scholar
  16. [15]
    A.J. Shields, M. Cardona, H.T. Grahn and K. Ploog, Phys. Rev. B 47, 13922 (1993)ADSCrossRefGoogle Scholar
  17. [16]
    K. Leo, J. Shah, E.O. Göbel and T.C. Damen, Appl. Phys. Lett. 56, 2031 (1990)ADSCrossRefGoogle Scholar
  18. [17]
    J. Feldmann, J. Nunnenkamp, G. Peter, E. Göbel, J. Kuhl, K. Ploog, P. Dawson and C.T. Foxon, Phys. Rev. B 42, 5809 (1990)ADSCrossRefGoogle Scholar
  19. [18]
    E.E. Mendez, W.I. Wang, E. Calleja and C.E.T. Goncalves da Silva, Appl. Phys. Lett. 50, 1263 (1987)ADSCrossRefGoogle Scholar
  20. [19]
    F. Capasso, K. Mohammed and A.Y. Cho, IEEE J. Quantum Electron. QE-22, 1853 (1986)ADSCrossRefGoogle Scholar
  21. [20]
    J. Bleuse, G. Bastard and P. Voisin, Phys. Rev. Lett. 60, 220 (1988).ADSCrossRefGoogle Scholar
  22. E.E. Mendez, F. Agulló-Rueda and J.M. Hong, Phys. Rev. Lett. 60, 2426 (1988)ADSCrossRefGoogle Scholar

Copyright information

© Springer Science+Business Media New York 1994

Authors and Affiliations

  • A. J. Shields
    • 1
  • M. Cardona
    • 1
  1. 1.Max-Planck-Institut für FestkörperforschungStuttgartFederal Republic of Germany

Personalised recommendations